科研之友
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摘要
We report on molecular dynamics simulations of thin film buckling which show that during the buckling phenomena dislocations can be emitted from specific region of the film where the heterogeneous stress was found to be maximum and larger than in the planar adherent part. A scenario of formation of misfit dislocations in the planar interface which lead to stress relaxation is finally proposed.
- 出版日期2010-7-15
