An Analysis and Survey of the Development of Mutation Testing

作者:Jia Yue*; Harman Mark
来源:IEEE Transactions on Software Engineering, 2011, 37(5): 649-678.
DOI:10.1109/TSE.2010.62

摘要

Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest.

  • 出版日期2011-10