Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods

作者：Gorbunov Maxim S^*; Vasilegin Boris V; Antonov Andrey A; Osipenko Pavel N; Zebrev Gennady I; Anashin Vasily S; Emeliyanov Vladimir V; Ozerov Alexander I; Useinov Rustem G; Chumakov Alexander I; Pechenkin Alexander A; Yanenko Andrey V

来源：IEEE Transactions on Nuclear Science, 2012, 59(4): 1130-1135.

DOI：10.1109/TNS.2012.2183147

• Cf-252
• CMOS
• heavy ions
• laser
• microprocessor
• SEE
• SEFI
• SOI

The results on SEE sensitivity of 0.5 mu m SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle accelerator, pulsed laser technique and Cf-252 fission source) is provided for the cache. The possible sources of discrepancies between test results and the ways of data correction and methods of testing techniques' accuracy improvement are discussed.

• 出版日期2012-8