X-Ray Photoelectron Spectra of TbB66

作者:Shul'ga Yu M*; Kabachkov E N; Fursikov P V; Mironova S A; Shilkin S P; Kornev B I; Novikov V V
来源:Inorganic Materials, 2018, 54(1): 45-48.
DOI:10.1134/S0020168518010144

摘要

Polycrystalline TbB66 has been characterized by X-ray photoelectron spectroscopy. The surface layer of TbB66 has been shown to be substantially enriched in terbium. Moreover, the surface layer of TbB66 contains boron ions having a negatively charge whose magnitude exceeds that in the case of the reference compound TbB4.

  • 出版日期2018-1

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