摘要

Copper diffusion coefficients were measured in glass melts with the base compositions xNa(2)O center dot(100-x)SiO(2), x = 15, 20, 26 and 33 mol% and (26-x)Na(2)O center dot xCaO.74SiO(2), x = 0, 5, 10 and 15 mol% doped with 1 mol% CuO in the temperature range from 900 to 1150 degrees C by square-wave voltammetry. The current-potential curves recorded exhibit two distinct maxima which are attributed to the reduction of Cu(2+) to Cu(+) and Cu(+) to metallic copper. The peak currents decrease with decreasing temperature. The mean diffusion coefficients for the Cu(+)/Cu(2+)-species are calculated from the peak currents and fitted to Arrhenius equation. The activation energies of the copper diffusion are in the range from 126 to 170 kJ mol(-1). Diffusion coefficients related to the same viscosity decrease with increasing Na(2)O-concentration. The incorporation of copper into the melt structure is discussed.

  • 出版日期2010-5-15