Automatic system for electron tomography data collection in the ultra-high voltage electron microscope

作者：Cao, Meng^*; Nishi, Ryuji; Wang, Fang

来源：Micron, 2017, 103: 29-33.

DOI：10.1016/j.micron.2017.09.006

• Electron tomography
• Auto tracking
• Auto focus
• Data collection
• Image stitching

In this study, we report an automatic system for collection of tilt series for electron tomography based on the ultra-HVEM in Osaka University. By remotely controlling the microscope and reading the observation image, the system can track the field of view and do focus in each tilt angle. The automatic tracking is carried out with an image matching technique based on normalized correlation coefficient. Auto focus is realized by the optimization of image sharpness. A toolkit that can expand the field of view with technique of image stitching is also developed. The system can automatically collect the tilt series with much smaller time consumption.

• 出版日期2017-12
• 单位西安交通大学