科研之友
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摘要
Coatings prepared in the laboratory and on a pilot coater have been subjected to a SEM cross-sectional analysis without applying an embedding resin. The cross-sectioning was carried out using argon ion beam etching after the coated paper had been stabilized by a resin film and a nano-layer of gold particles had been sputtered on the coated side of the paper to enhance the conductivity of it under SEM. The image quality was excellent. Pigment, latex and voids/pores were clearly seen and subjected to image analysis to give porosity and pore size distribution. The results were compared to the pore structure obtained from mercury porosimetry using the same coating formulation laid on a plastic base. Both the images and the image analysis showed significant deviations from mercury intrusion characterization.
- 出版日期2010
