Atomic force microscopy based, multiphoton, photoelectron emission imaging

作者:Spanakis E; Chimmalgi A; Stratakis E; Grigoropoulos C P; Fotakis C; Tzanetakis P*
来源:Applied Physics Letters, 2006, 89(1): 013110.
DOI:10.1063/1.2219120

摘要

Images of photoelectron emission from metallic surfaces were obtained with a modified atomic force microscope operating in air. Illumination of the samples was achieved in the near field of a metal-coated microcantilever tip, placed in the beam of a femtosecond pulsed laser that is incident at a grazing angle with respect to the sample surface. Photoelectron currents were measured through the tip with a prototype amplifier. The power law dependence of average photocurrent on light intensity is compatible with multiphoton photoelectric effect and the work function of the metal covering a particular area on the two-metal patterned samples used.

  • 出版日期2006-7-3