Analysis of Key Factors for High Yield AMOLED Display

作者:Kim Hojoong*; Jung Chanhyuk; Kwon Jang Yeon; Kim Songkuk
来源:Journal of Display Technology, 2015, 11(9): 783-787.
DOI:10.1109/JDT.2015.2451676

摘要

To figure out the key factors of the reliability of AMOLED displays, we analyzed the luminance degradation based on a large-scale simulation. The initial non-uniformity and aging parameters were incorporated into the luminance decay model. For each set of parameters, we simulated the luminance degradation of 10,000 panels for 100,000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.

  • 出版日期2015-9

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