An embeddable SOC real-time prediction technology for TDDB

作者：Xin Weiping^*; Zhuang Yiqi; Li Xiaoming

来源：Chinese Journal of Semiconductors, 2012, 33(11).

DOI：10.1088/1674-4926/33/11/115009

• real-time
• Real-time prediction
• Silicon area
• SOC
• Standard CMOS process
• TDDB
• Warning signals

This paper presents an embeddable SOC real-time prediction circuit and method for TDDB. When the SOC under test is fails due to TDDB, the prediction circuit is capable of issuing a warning signal. The prediction circuit, designed by using a standard CMOS process, occupies a small silicon area and does not share any signal with the circuits under test, therefore, the possibility of interference with the surrounding circuits is safely excluded.

• 出版日期2012
• 单位西安电子科技大学