A knife-edge measurement of the beam profile of STXM 5.3.2.2 using a focussed ion beam milled metallic glass

作者:Burke Kerry B; Luber Erik J; Holmes Natalie P; Murray Andrew J; Belcher Warwick J; Zhou Xiaojing; Mitlin David; Dastoor Paul C*
来源:Journal of Electron Spectroscopy and Related Phenomena, 2012, 185(11): 453-457.
DOI:10.1016/j.elspec.2012.07.003

摘要

We present a simple knife-edge measurement of the STXM 5.3.2.2 synchrotron X-ray beam width. The knife edge was constructed by ion beam milling a metallic glass alloy consisting of 60% gold, 20% nickel and 20% hafnium and was determined to be well-defined to within 2 nm by TEM. An asymmetric beam profile of 120 nm FWHM in the vertical direction and 150 nm FWHM in the horizontal direction was determined and was observed to depart from the expected Airy function profile.

  • 出版日期2012-11