A quantum wave based compact modeling approach for the current in ultra-short DG MOSFETs suitable for rapid multi-scale simulations

作者：Hosenfeld Fabian^*; Horst Fabian; Iniguez Benjamin; Lime Francois; Kloes Alexander

来源：Solid-State Electronics, 2017, 137: 70-79.

DOI：10.1016/j.sse.2017.08.006

• Ultra-short Double-Gate (DG) MOSFET
• Non Equilibrium Green's NEGF)
• Source-to-Drain (SD) tunneling
• Compact model
• Multi-scale simulation

Source-to-drain (SD) tunneling decreases the device performance in MOSFETs falling below the 10 nm channel length. Modeling quantum mechanical effects including SD tunneling has gained more importance specially for compact model developers. The non-equilibrium Green's NEGF) has become a state-of-the-art method for nano-scaled device simulation in the past years. In the sense of a multiscale simulation approach it is necessary to bridge the gap between compact models with their fast and efficient calculation of the device current, and numerical device models which consider quantum effects of nano-scaled devices. In this work, an NEGF based analytical model for nano-scaled doublegate (DG) MOSFETs is introduced. The model consists of a closed-form potential solution of a classical compact model and a 1D NEGF formalism for calculating the device current, taking into account quantum mechanical effects. The potential calculation omits the iterative coupling and allows the straightforward current calculation. The model is based on a ballistic NEGF approach whereby backscattering effects are considered as second order effect in a closed-form. The accuracy and scalability of the non-iterative DG MOSFET model is inspected in comparison with numerical NanoMOS TCAD data for various channel lengths. With the help of this model investigations on short-channel and temperature effects are performed.

• 出版日期2017-11