An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

作者：Sterpone L^*; Battezzati N; Kastensmidt F Lima; Chipana R

来源：IEEE Transactions on Nuclear Science, 2011, 58(5): 2333-2340.

DOI：10.1109/TNS.2011.2161886

• Characterization
• flash-based FPGAs
• single event transients (SETs)

A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.