Diagnosis of Local Spot Defects in Analog Circuits

作者：Huang Ke^*; Stratigopoulos Haralampos G; Mir Salvador; Hora Camelia; Xing Yizi; Kruseman Bram

来源：IEEE Transactions on Instrumentation and Measurement, 2012, 61(10): 2701-2712.

DOI：10.1109/TIM.2012.2196390

• Analog circuit testing
• automobile electronics
• failure analysis (FA)
• fault diagnosis
• pattern recognition

We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For this purpose, the method relies on a combination of multiclass classifiers that are trained using data from fault simulation. The method is demonstrated on an industrial large-scale case study. The device under consideration is a controller area network transceiver used in automobile systems. This device demands high-quality control due to the reliability requirements of the application wherein it is deployed. The diagnosis problem is discussed by taking into consideration the realities of this case study.

• 出版日期2012-10