作者：Tokuda Takashi*; Kawamura Toshikazu; Masuda Keita; Hirai Tomohiro; Takehara Hironari; Ohta Yasumi; Motoyama Mayumi; Takehara Hiroaki; Noda Toshihiko; Sasagawa Kiyotaka; Ohta Jun; Okitsu Teru; Takeuchi Shoji
来源：IEEE Design and Test, 2016, 33(4): 37-48.
DOI：10.1109/MDAT.2016.2560137
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