科研之友
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摘要
This work extends to the switch level the verification and testing techniques based upon boolean satisfiability (SAT), so that SAT-based methodologies can be applied to circuits that cannot be well described at the gate level. The main achieved goal was to define a boolean model describing switch-level circuit operations as a SAT problem instance, to be applied to combinational equivalence checking and bridging-fault test generation. Results are provided for a set of combinational CMOS circuits, showing the feasibility of SAT-based verification and testing of switch-level circuits.
- 出版日期2014-2
