Analysis of Residue Integration Sampling With Improved Jitter Immunity

作者：Oh Taehwan^*; Maghari Nima; Gubbins David; Moon Un Ku

来源：IEEE Transactions on Circuits and Systems II-Express Briefs, 2011, 58(7): 417-421.

DOI：10.1109/TCSII.2011.2158273

• Analog-digital conversion (ADC)
• charge sampling
• impulse sampler
• integration sampler
• jitter
• sampling methods

The improved jitter immunity of window residue sampling (WRS) is analyzed in this brief. We build a mathematical model for WRS and compare the signal-to-noise ratio performance with the conventional impulse and integration sampling methods. Simulation results show that WRS has better jitter immunity of approximately 3 dB compared with conventional impulse sampling at the Nyquist input frequency.

• 出版日期2011-7