摘要

Traditional RF/microwave test and measurement (T&M) instruments are dedicated "boxes" built with application specific and general purpose silicon, firmware and embedded software. In contrast, software defined synthetic instruments (SDSI) "synthesize" multiple instruments - spectrum analyzers, digital storage oscilloscopes, RF receivers, signal generators - with digital signal processing (DSP) software and firmware on commercial embedded multicore processors and field programmable gate arrays (FPGA). SDSIs offer advantages over a suite of traditional instruments, dramatically reducing test system life cycle costs. Addressing equipment obsolescence and the portability of test programs are two of their most important benefits, especially to organizations with large fleets of RF/microwave test systems or performing production tests. SDSIs provide a watershed infrastructure for developing test systems that remain stable throughout the test life cycle.

  • 出版日期2015-3