All-optical control and metrology of electron pulses

作者：Kealhofer, C.; Schneider, W.; Ehberger, D.; Ryabov, A.; Krausz, F.^*; Baum, P.^*

来源：Science, 2016, 352(6284): 429-433.

DOI：10.1126/science.aae0003

• LASER
• ACCELERATION
• DIFFRACTION
• COMPRESSION
• MICROSCOPY
• OPERATION

Short electron pulses are central to time-resolved atomic-scale diffraction and electron microscopy, streak cameras, and free-electron lasers. We demonstrate phase-space control and characterization of 5-picometer electron pulses using few-cycle terahertz radiation, extending concepts of microwave electron pulse compression and streaking to terahertz frequencies. Optical-field control of electron pulses provides synchronism to laser pulses and offers a temporal resolution that is ultimately limited by the rise-time of the optical fields applied. We used few-cycle waveforms carried at 0.3 terahertz to compress electron pulses by a factor of 12 with a timing stability of <4 femtoseconds (root mean square) and measure them by means of field-induced beam deflection (streaking). Scaling the concept toward multiterahertz control fields holds promise for approaching the electronic time scale in time-resolved electron diffraction and microscopy.

• 出版日期2016-4-22