A 76-84-GHz 16-Element Phased-Array Receiver With a Chip-Level Built-In Self-Test System

作者：Kim Sang Young^*; Inac Ozgur; Kim Choul Young; Shin Donghyup; Rebeiz Gabriel M

来源：IEEE Transactions on Microwave Theory and Techniques, 2013, 61(8): 3083-3098.

DOI：10.1109/TMTT.2013.2265016

• Automotive radars
• built-in self-test (BIST)
• millimeter-wave integrated circuits
• phase shifters
• phased arrays
• silicon-germanium

This paper presents a 16-element phased-array receiver for 76-84-GHz applications with built-in self-test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of < 1 dB and < 10 degrees at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.

• 出版日期2013-8