A double toroidal analyzer for scanning probe electron energy spectrometer

作者：Xu Chun Kai^*; Zhang Pan Ke; Li Meng; Chen Xiang Jun

来源：Chinese Physics B, 2014, 23(7): 073402.

DOI：10.1088/1674-1056/23/7/073402

• double toroidal analyzer
• scanning probe electron energy spectroscopy
• electron energy loss spectroscopy
• secondary electron emission spectroscopy

An ultra-high vacuum (UHV) compatible electron spectrometer employing a double toroidal analyzer has been developed. It is designed to be combined with a custom-made scanning tunneling microscope (STM) to study the spatially localized electron energy spectrum on a surface. A tip-sample system composed of a piezo-driven field-emission tungsten tip and a sample of highly ordered pyrolytic graphite (HOPG) is employed to test the performance of the spectrometer. Two-dimensional images of the energy-resolved and angle-dispersed electrons backscattered from the surface of HOPG are obtained, the performance is optimized and the spectrometer is calibrated. A complete electron energy loss spectrum covering the elastic peak to the secondary electron peaks for the HOPG surface, acquired at a tip voltage of -140 V and a sample current of 0.5 pA, is presented, demonstrating the viability of the spectrometer.

• 出版日期2014-7
• 单位中国科学技术大学