Test of Ultra Fast Silicon Detectors for picosecond time measurements with a new multipurpose read-out board

作者：Minafra N^*; Al Ghoul H; Arcidiacono R; Cartiglia N; Forthomme L; Mulargia R; Obertino M; Royon C

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2017, 867: 88-92.

DOI：10.1016/j.nima.2017.04.032

• Time-of-flight
• Time precision
• Ultra Fast Silicon Detectors
• Charge Sensitive Amplifier
• Picosecond Time Measurement

Ultra Fast Silicon Detectors (UFSD) are sensors optimized for timing measurements employing a thin multiplication layer to increase the output signal. A multipurpose read-out board hosting a low-cost, low-power fast amplifier was designed at the University of Kansas and tested at the European Organization for Nuclear Research (CERN) using a 180 GeV pion beam. The amplifier has been designed to read out a wide range of detectors and it was optimized in this test for the UFSD output signal. In this paper we report the results of the experimental tests using 50 mu m thick UFSD with a sensitive area of 1.4 mm(2). A timing precision below 30 ps was achieved.

• 出版日期2017-9-21