Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applications

作者：Chen, R. M.^*; Mahatme, N. N.; Diggins, Z. J.; Wang, L.; Zhang, E. X.; Chen, Y. P.; Liu, Y. N.; Narasimham, B.; Witulski, A. F.; Bhuva, B. L.; Fleetwood, D. M.

来源：IEEE Transactions on Nuclear Science, 2018, 65(8): 1823-1829.

DOI：10.1109/TNS.2018.2823385

• Frequency
• linear energy transfer
• sequential circuit
• single-event transient (SET)
• single-event upset (SEU)
• soft errors
• supply voltage
• temporal masking effect

Analysis of temporal masking effects of single-event upsets (SEUs) on master-slave flip-flops (FFs) is provided, considering the difference of SEU cross sections between master and slave latches. An improved model of temporal masking effects of SEUs in master-slave FFs is proposed and demonstrated through alpha-particle single-event effect (SEE) experiments. Based on the improved model, an effective and accurate methodology to quantitatively evaluate single-event transient and SEU-induced error cross sections of FF chains is proposed. Implications of SEE hardening for sequential circuits are discussed.

• 出版日期2018-8
• 单位清华大学; 北京微电子技术研究所