X-ray diffraction line profile analysis of polyvinyl alcohol capped cadmium sulphide nanostructured films

作者：Mochahari P K^*; Sarma K C

来源：Indian Journal of Physics and Proceedings of the Indian Association for the Cultivation of Science, 2014, 88(12): 1265-1270.

DOI：10.1007/s12648-014-0590-7

• X-ray analysis
• Williamson-Hall plot
• Size-strain plot
• UHRTEM
• AFM

Nanostructured cadmium sulphide thin films have been synthesized onto suitably cleaned glass substrates by simple chemical bath deposition method at room temperature using polyvinyl alcohol as capping agent. X-ray diffraction study confirms the formation of nanocrystalline cubic phase of cadmium sulphide in the films. Various physical parameters such as lattice constant, stress, strain, dislocation density, etc. have been calculated and are found to be affected by the molarity of the solution. The ultra-high resolution transmission electron microscopic study shows that the shape of the particles is nearly spherical and the average particle size agrees well with the result obtained from X-ray diffraction study. Selected area electron diffraction patterns have also supported the formation of cubic phase of cadmium sulphide. The surface texture of the prepared films investigated using atomic force microscopy confirms the formation of nanocluster of high density cadmium sulphide nanoparticles. The surface is slightly non-smooth with uniform crack-free and densely packed microstructure.

• 出版日期2014-12