Area detector corrections for high quality synchrotron X-ray structure factor measurements

作者：Skinner Lawrie B^*; Benmore Chris J; Parise John B

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2012, 662(1): 61-70.

DOI：10.1016/j.nima.2011.09.031

• Amorphous
• X-ray diffraction
• Area detector
• Corrections

Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe(2) and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level. Published by Elsevier B.V.

• 出版日期2012-1-11