Morphology and optical properties of single- and multi-layer InAs quantum dots

作者：Hsu Chiung Chih^*; Hsu Ray Quen; Wu Yue Han

来源：Journal of Electron Microscopy, 2010, 59: S149-S154.

DOI：10.1093/jmicro/dfq053

• quantum dot
• strain
• scanning transmission electron microscopy
• photoluminescence
• reciprocal spacer mapping
• fast Fourier transformation

An understanding of the structural and optical properties of quantum dots (QDs) is critical for their use in optical communication devices. In this study, single- and multi-layer self-organized InAs QDs grown on (001) GaAs substrates by molecular beam epitaxy (MBE) were investigated. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) images show that the lateral size of multi-layer InAs QDs are larger and flatter than single-layer InAs QDs, which are oval-shaped. The change in shape and size may be attributed to the presence of InGaAs spacer layers in multi-layer InAs QDs. Reciprocal spacer mapping and fast Fourier transformation images clearly show that InGaAs spacer layers present in the multi-layer InAs QDs structures help to release the strain originally existing in the QDs. In addition, the photoluminescence peak of the multi-layer InAs QDs is broader than QD in the single-layer one, which implies that the multi-layer InAs QDs size variation is more random than the single-layer one and this corresponds with the HAADF-STEM images. These results prove that spacer layers release strain influencing the morphology and optical properties of the QDs.

• 出版日期2010-8