摘要
As device miniaturization approaches nanoscale dimensions, interfaces begin to dominate electrical properties. Here the system archetype Au/SrTiO3 is used to examine the origin of size dependent transport properties along metal-oxide interfaces. We demonstrate that a transition between two classes of size dependent electronic transport mechanisms exists, defined by a critical size e. At sizes larger than e an edge-related tunneling effect proportional to 1/D (the height of the supported Au nanoparticle) is observed; interfaces with sizes smaller than e exhibit random fluctuations in current. The ability to distinguish between these mechanisms is important to future developments in nanoscale device design.
- 出版日期2013-12-16