Study of band inversion in the PbxSn1-xTe class of topological crystalline insulators using x-ray absorption spectroscopy

作者:Mitrofanov K V; Kolobov A V*; Fons P; Krbal M; Tominaga J; Uruga T
来源:Journal of Physics: Condensed Matter , 2014, 26(47): 475502.
DOI:10.1088/0953-8984/26/47/475502

摘要

PbxSn1-xTe and PbxSn1-x Se crystals belong to the class of topological crystalline insulators where topological protection is achieved due to crystal symmetry rather than time-reversal symmetry. In this work, we make use of selection rules in the x-ray absorption process to experimentally detect band inversion along the PbTe(Se)-SnTe(Se) tie-lines. The observed significant change in the ratio of intensities of L-1 and L-3 transitions along the tie-line demonstrates that x-ray absorption can be a useful tool to study band inversion in topological insulators.

  • 出版日期2014-11-26