摘要
PbxSn1-xTe and PbxSn1-x Se crystals belong to the class of topological crystalline insulators where topological protection is achieved due to crystal symmetry rather than time-reversal symmetry. In this work, we make use of selection rules in the x-ray absorption process to experimentally detect band inversion along the PbTe(Se)-SnTe(Se) tie-lines. The observed significant change in the ratio of intensities of L-1 and L-3 transitions along the tie-line demonstrates that x-ray absorption can be a useful tool to study band inversion in topological insulators.
- 出版日期2014-11-26