A Novel Method of MOSFET Series Resistance Extraction Featuring Constant Mobility Criteria and Mobility Universality

作者：Lin Da Wen^*; Cheng Ming Lung; Wang Shyh Wei; Wu Chung Cheng; Chen Ming Jer

来源：IEEE Transactions on Electron Devices, 2010, 57(4): 890-897.

DOI：10.1109/TED.2010.2041508

• MOSFET
• series resistance
• universal mobility

A method of MOSFET series resistance extraction is established in this paper. The core of this method relies on the constant mobility criteria, while for different gate lengths, it preserves the shape of universal mobility curves in the high-vertical-field regime. Consequently, the series resistance of a MOSFET can be extracted in an analytical and self-consistent manner, achieved without the knowledge of the gate oxide thickness, channel length, channel doping, or channel stress. Reasonable values of extracted series resistance are demonstrated in a wide range of gate length. Technology computer-aided design simulation further corroborates the validity of the proposed method, particularly for devices with heavily doped source/drain extensions. The constant mobility criteria with respect to the bulk charge linearization coefficient are also verified.

• 出版日期2010-4