Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces

作者：Talu Stefan; Stach Sebastian; Mahajan Aman; Pathak Dinesh^*; Wagner Tomas; Kumar Anshul; Bedi R K; Talu Mihai

来源：Electronic Materials Letters, 2014, 10(4): 719-730.

DOI：10.1007/s13391-013-3270-4

• organic semiconductors
• CuTsPc films
• atomic force microscopy
• multifractal analysis
• surface roughness

This paper presents a multifractal approach to characterize the structural complexity of 3D surface roughness of CuTsPc films on the glass and quartz substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films prepared by drop cast method were investigated. CuTsPc films surface roughness was studied by AFM in tappingmode (TM), in an aqueous environment, on square areas of 100 mu m(2) and 2500 mu m(2). A detailed methodology for CuTsPc films surface multifractal characterization, which may be applied for AFM data, was also presented. Analysis of surface roughness revealed that CuTsPc films have a multifractal geometry at various magnifications. The generalized dimension D-q and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of CuTsPc films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.

• 出版日期2014-7