An evaluation method for nanoscale wrinkle

作者：Liu, Y. P.; Wang, C. G.^*; Zhang, L. M.; Tan, H. F.

来源：Physica E: Low-Dimensional Systems and Nanostructures , 2016, 80: 191-194.

DOI：10.1016/j.physe.2016.02.007

• Thin film
• Wrinkle Spectrum analysis
• Wrinkling wavelength

In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling.

• 出版日期2016-6
• 单位哈尔滨工业大学