Membrane characterization by microscopic methods: Multiscale structure

作者：Wyart Y; Georges G; Demie C; Amra C; Moulin P^*

来源：Journal of Membrane Science, 2008, 315(1-2): 82-92.

DOI：10.1016/j.memsci.2008.02.010

• AFM
• SEM
• white light interferometry
• roughness
• porosity

A great number of studies have been carried out to obtain a better understanding of membrane fouling so as to be able to limit its effects. The parameters studied are many and can be classified into membrane structure parameters (porosity, roughness, pore size, pore shape, pore size distribution) and membrane/effluent coupling parameters (material, surface charge, hydrophobicity, etc...). In the case of the membrane structure parameters, three types of techniques can be used: displacement techniques, tracer retention techniques and microscopic techniques. In this paper, first microscopy observation methods are reviewed, and then the potential of three different techniques is studied. Scanning Electron Microscopy (SEM) provides information on surface porosity and layer thickness. The pore sizes measured with this technique were in agreement with the membrane cut off values given by the manufacturers. Atomic Force Microscopy (AFM) and White Light Interferometry (WLI) provide surface RMS roughnesses that depend on the observation scale. The RMS roughnesses that were obtained ranged between 100 and 4000 nm. For 4 unused ceramic membranes of different cut-offs and for 3 different scan sizes, the passage from one scan size to another is continuous in terms of information provided.

• 出版日期2008-5-1