Analysis of Subthreshold Current Reset Noise in Image Sensors

作者：Teranishi Nobukazu^*

来源：Sensors (Switzerland), 2016, 16(5): 663.

DOI：10.3390/s16050663

• CMOS image sensor
• 3-transistor scheme
• reset noise
• subthreshold current
• hard reset
• soft reset
• feedback reset
• tapered reset

To discuss the reset noise generated by slow subthreshold currents in image sensors, intuitive and simple analytical forms are derived, in spite of the subthreshold current nonlinearity. These solutions characterize the time evolution of the reset noise during the reset operation. With soft reset, the reset noise tends root mkT/2C(PD) when t -> infinity, in full agreement with previously published results. In this equation, CPD is the photodiode (PD) capacitance and m is a constant. The noise has an asymptotic time dependence of t(-1), even though the asymptotic time dependence of the average (deterministic) PD voltage is as slow as logt. The flush reset method is effective because the hard reset part eliminates image lag, and the soft reset part reduces the noise to soft reset level. The feedback reset with reverse taper control method shows both a fast convergence and a good reset noise reduction. When the feedback amplifier gain, A, is larger, even small value of capacitance, C-P, between the input and output of the feedback amplifier will drastically decrease the reset noise. If the feedback is sufficiently fast, the reset noise limit when t -> 8, becomes mkT(C-PD + C-P1)(2)/2q(2)A(C-PD + (1 + A)C-P) in terms of the number of electron in the PD. According to this simple model, if C-PD = 10 fF, C-P/C-PD = 0.01, and A = 2700 are assumed, deep sub-electron rms reset noise is possible.

• 出版日期2016-5