Accurate control of the electrode shape for high resolution shearforce regulated SECM

作者：Etienne Mathieu^*; Moulin Jean Paul; Gourhand Sebastien

来源：Electrochimica Acta, 2013, 110: 16-21.

DOI：10.1016/j.electacta.2013.03.096

• SECM
• Shearforce
• Nanoelectrode
• Insulating sheath
• Imaging

A new setup allowing the careful control of the electrode shape for application in SECM is presented. It allows alternately electrode polishing and scanning electrochemical microscopy experiment (SECM). The shape of the electrode can be controlled and reproduced. Conical electrode can be obtained displaying the electrode at the center of the cone or on the side, at a defined distance from the tip end. The conical shape allows decreasing the diameter of the insulating material of nanoelectrodes and a final step of polishing allows controlling the Rg of the electrode. The influence of electrode shape and Rg on the topographic and electrochemical measurements has been studied and was found critical for shearforce regulated constant-distance mode SECM. The simplicity of the technology described in this manuscript should make it applicable in other laboratories.

• 出版日期2013-11-1