An electron beam ion trap and source for re-acceleration of rare-isotope ion beams at TRIUMF

作者：Blessenohl M A; Dobrodey S^*; Warnecke C; Rosner M K; Graham L; Paul S; Baumann T M; Hockenbery Z; Hubele R; Pfeifer T; Ames F; Dilling J; Lopez Urrutia J R Crespo

来源：Review of Scientific Instruments, 2018, 89(5): 052401.

DOI：10.1063/1.5021045

Electron beam driven ionization can produce highly charged ions (HCIs) in a few well-defined charge states. Ideal conditions for this are maximally focused electron beams and an extremely clean vacuum environment. Acryogenic electron beam ion trap fulfills these prerequisites and delivers very pure HCI beams. The Canadian rare isotope facility with electron beam ion source-electron beam ion sources developed at the Max-Planck-Institut fur Kernphysik (MPIK) reaches already for a 5 ke V electron beam and a current of 1 A with a density in excess of 5000 A/cm(2) by means of a 6 T axial magnetic field. Within the trap, the beam quickly generates a dense HCI population, tightly confined by a space-charge potential of the order of 1 keV times the ionic charge state. Emitting HCI bunches of approximate to 10(7) ions at up to 100 Hz repetition rate, the device will charge-breed rare-isotope beams with the mass-overcharge ratio required for re-acceleration at the Advanced Rare IsotopE Laboratory (ARIEL) facility at TRIUMF. We present here its design and results from commissioning runs at MPIK, including X-ray diagnostics of the electron beam and charge-breeding process, as well as ion injection and HCI-extraction measurements. Published by AIP Publishing.

• 出版日期2018-5