Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

作者：Meng L^*; Nagalingam D; Bhatia C S; Street A G; Phang J C H

来源：Solar Energy Materials and Solar Cells, 2011, 95(9): 2632-2637.

DOI：10.1016/j.solmat.2011.05.022

• Morphological defect
• Electrical defect
• Solar cell
• Scanning Electron Acoustic Microscopy
• Electron Beam Induced Current

Morphological and electrical defects in polycrystalline silicon solar cells are distinguished by scanning electron acoustic microscopy (SEAM) and electron beam induced current (EBIC) techniques, respectively. It was found that while some defects are both morphologically and electrically detectable, some are predominantly only either electrical or morphological in nature. Combining both SEAM and EBIC is therefore an ideal approach as the two techniques can provide complementary information on both the morphological and electrical manifestation of the defects.

• 出版日期2011-9