Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor

作者：Roche N J H^*; Khachatrian A; Buchner S; Foster Charles C; Ferlet Cavrois V; Muschitiello M; Miller F; Morand S; Warner J; Decker T; McMorrow D

来源：IEEE Transactions on Nuclear Science, 2015, 62(6): 2679-2686.

DOI：10.1109/TNS.2015.2498280

• Analog-to-digital converter
• heavy ions
• laser
• latchup
• single events

Focused, pulsed laser-light is used to investigate single-event latchup in an analog-to-digital converter (AD9240) through the generation of charge collection spectra and their dependence on bias, laser pulse intensity and strike location. Large bipolar single-event transients were identified as precursors to latchup. They occurred at bias voltages just below the latchup holding voltage and in regions that became sensitive to single-event latchup at voltages above the holding voltage. Charge collection spectra obtained from spatial scans involving the pulsed laser had features similar to those obtained from heavy-ion irradiation. Both approaches indicated enhanced charge collection at supply voltages just below the holding voltage.

• 出版日期2015-12