System-Level Electric Field Exposure Assessment by the Fault Tree Analysis

作者：Jin, Lijun; Peng, Chenyi^*; Jiang, Tao

来源：IEEE Transactions on Electromagnetic Compatibility, 2017, 59(4): 1095-1102.

DOI：10.1109/TEMC.2017.2647961

• Electric field
• exposure assessment
• fault tree analysis
• reliability
• substation

This paper focuses on assessing the electric field exposure in the whole substation by the fault tree analysis. The component-level exposure situation along the path is studied by the reliability analysis, where the field distribution and the moving people are integrated. The system-level exposure situation is then analyzed by generating the exposure fault tree based on the component-level data. The exposure failure probability of the whole substation is ultimately evaluated by analyzing the fault tree's series-parallel system. The influences of the layers and the bounded parameters on the size of the fault tree are also studied in this paper. The results of the case study show that, with the help of the fault tree analysis, the complex exposure situation in a large substation can be clearly evaluated by a probability value.

• 出版日期2017-8
• 单位同济大学