A linear CMOS temperature sensor with an inaccuracy of +/- 0.15 degrees C

作者：Lin Chun Wei^*; Lin Sheng Feng

来源：IEICE Electronics Express, 2012, 9(20): 1556-1561.

DOI：10.1587/elex.9.1556

• temperature sensor
• temperature dependence
• mobility degradation
• threshold voltage
• temperature error

In this paper, we propose a current mode linear CMOS temperature sensor profiting on increasing the accuracy of thermal monitoring. Concerning the temperature dependence of threshold voltage drift and mobility degradation, the proposed method removes the critical nonlinear terms realizing very linear relationship. Through driving two temperature-dependent current sources into particular operation region with different bias conditions, we utilize a compensation scheme among the resulted complementary temperature dependences of current sources which cancels major nonlinear effect. By TSMC 0.35 mu m CMOS process, within the temperature range from -20 degrees C to 100 degrees C, the measured results of an implemented chip show that temperature error and power consumption are +/- 0.15 degrees C and 96 mu W respectively.

• 出版日期2012