A method to assess the robustness of cryptographic circuits at the design stage

作者：Arevalo Garbayo M^*; Portela Garcia M; Garcia Valderas M; Lopez Ongil C; Entrena L

来源：MICROELECTRONICS JOURNAL, 2014, 45(10): 1354-1360.

DOI：10.1016/j.mejo.2013.12.012

• Cryptographic circuits
• Differential fault attacks
• Fault-based attack
• Fault injection
• Single event transient

This paper proposes the use of an FPGA-based fault injection technique, AMUSE, to study the effect of malicious attacks on cryptographic circuits. Originally, AMUSE was devised to analyze the soft error effects (SEU and SET) in digital circuits. However, many of the fault-based attacks used in cryptanalysis produce faults that can be modeled as bit-flip in memory elements or transient pulses in combinational logic, as in faults due to radiation effects. Experimental results provide information that allows the cryptographic circuit designer to detect the weakest areas in order to implement countermeasures at design stage.

• 出版日期2014-10