摘要

Lanthanum substituted bismuth titanate thin films were deposited using an aqueous chemical solution deposition method. Varying the composition of Bi4-xLaxTi3O12, with x = 0.5, 0.65, 0.75 and 0.85, is shown to have a large influence on the microstructure and properties of the films. Increasing the amount of La3+, x, from 0.5 to 0.85 led to a decrease of the remanent polarization (P-r) from 6.2 to eventually 0 mu C/cm(2). This decrease of P-r is explained by means of X-ray diffraction (XRD) study, which shows that there is an increased preference for c-axis orientation upon increasing the La3+ concentration. Furthermore, a strong decrease of the grain size upon increasing x is observed in a scanning electron microscopic (SEM) study. The concurrent increase of domain pinning on the grain boundaries is a second effect which may be responsible for the deterioration of the ferroelectric property at larger x.

  • 出版日期2007-6