A high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure measurement

作者：Murata Naoyoshi^*; Kobayashi Makoto; Okada Yukari; Suzuki Takuya; Nitani Hiroaki; Niwa Yasuhiro; Abe Hitoshi; Wada Takahiro; Mukai Shingo; Uehara Hiromitsu; Ariga Hiroko; Takakusagi Satoru; Asakura Kiyotaka

来源：Review of Scientific Instruments, 2015, 86(3): 034102.

DOI：10.1063/1.4914459

We present the design and performance of a high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure (XAFS) spectra. The cell has a large fluorescence XAFS window (116 mm(phi)) near the sample in the cell, realizing a large half-cone angle of 56 degrees. We use a small heater (25 x 35 mm(2)) to heat the sample locally to 873 K. We measured a Pt-SnO2 thin layer on a Si substrate at reaction conditions having a high activity. In situ measurement enables the analysis of the difference XAFS spectra between before and during the reaction to reveal the structure change during the operation.

• 出版日期2015-3