A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

作者：Szlachetko J^*; Nachtegaal M; de Boni E; Willimann M; Safonova O; Sa J; Smolentsev G; Szlachetko M; van Bokhoven J A; Dousse J Cl; Hoszowska J; Kayser Y; Jagodzinski P; Bergamaschi A; Schmitt B; David C; Luecke A

来源：Review of Scientific Instruments, 2012, 83(10): 103105.

DOI：10.1063/1.4756691

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

• 出版日期2012-10