摘要
Thin films of organic semiconductor copper phthalocynanine (CuPc) and Al were deposited in sequence by vacuum evaporation on a glass substrate with Ag source and drain electrodes. The effect of displacement on the properties of the fabricated field effect transistor with metal (aluminium)-semiconductor (copper phthalocyanine) Schottky junction was investigated. It was observed that the drain-source resistance of this organic field effect transistor was decreased with displacement.
- 出版日期2012