Analysis of Passive Memristive Devices Array: Data-Dependent Statistical Model and Self-Adaptable Sense Resistance for RRAMs

作者：Shin Sangho^*; Kim Kyungmin; Kang Sung Mo

来源：Proceedings of the IEEE, 2012, 100(6): 2021-2032.

DOI：10.1109/JPROC.2011.2165690

• Adaptable resistance
• data pattern dependence
• memristive devices
• nonvolatile resistive memory
• resistive random access memory (RRAM)
• statistical model

In this paper, a 2 x 2 equivalent statistical circuit model is presented to deal with sneak currents and random data distributions for design and analysis of n x m passive memory arrays of memristive devices. This data-dependent 2 x 2 model enables a broad range of analysis, such as the optimum detection voltage margin, with computational efficiency and no limit on the memory array size. We propose self-adaptable sense resistors that can find their statistical optimum values for reading stored data patterns by composing them with either a replica of a part of resistive random access memory (RRAM) array or a part of RRAM array itself. Self-adaptable resistors can increase the average voltage detection margin by 46%, and reduce the average current consumption by 14% for the case of a 128 x 128 passive array with OFF-to-ON resistance ratio of 10(3).

• 出版日期2012-6