Processing and interpretation of EBSD data gathered from plastically deformed metals

作者：Godfrey A^*; Mishin O V; Liu Q

来源：Materials Science and Technology, 2006, 22(11): 1263-1270.

DOI：10.1179/174328406X130911

• EBSD
• dislocation boundary
• orientation noise
• angular resolution

The use of electron backscattered diffraction (EBSD) for the investigation of dislocation boundary microstructures formed during plastic deformation of metals is discussed. A quantitative description is given of the angular resolution limitation in EBSD mapping. The ability of filtering using orientation averaging to improve the angular resolution of the EBSD data is then considered. Orientation filtering is tested using both simulated EBSD maps where a certain orientation noise function and level are assumed and additionally by direct comparison of EBSD and orientation measurements taken in the transmission electron microscope from the same region of a thin foil. Orientation filtering results in an improvement of data quality, but filtering can also introduce artefacts that cannot be distinguished from real microstructural features. The main limitation at present in developing specific recommendations for the use of filtering methods is that more information is required about the nature of the orientation noise at or near dislocation boundaries.

• 出版日期2006-11
• 单位清华大学