A Scan-Based On-Line Aging Monitoring Scheme

作者：Yi Hyunbean^*; Yoneda Tomokazu; Inoue Michiko

来源：Journal of Semiconductor Technology and Science, 2014, 14(1): 124-130.

DOI：10.5573/JSTS.2014.14.1.124

• Aging monitor
• scan test
• delay test
• on-line test
• system-on-chip (SoC)

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.

• 出版日期2014-2