Multiple superimposed tomography of probability on second electrical field

作者：Yan Yong Li^*; Zhao Yong Gui; Chen Ben Chi; Chen Yun; Ma Xiao Bing; Kong Xiang Ru

来源：Chinese Journal of Geophysics, 2008, 51(5): 1544-1550.

• electrical resistivity tomography
• second electrical field
• probability tomography
• space domain scanning (SDS) function
• normalized charge occurrence probability (NCOP) function

Based on integral formula, discrete second electrical field is expressed as a sum of elementary contributions coming from charges accumulated on the surfaces of resistivity discontinuity. The electrical field of a positive unit point charge is introduced as space domain scanning (SDS) function, and charge occurrence probability (COP) is defined as the cross-correlation of the second electrical field with the SDS function. In order to analyze COP anomalies, COP function is normalized. To test the effectiveness of probability tomography of second electrical field, we use finite element algorithm to synthesize second electrical field for several models, and implement Multiple Superimposed tomography of probability. The results are quite satisfactory.

• 出版日期2008-9
• 单位中国科学院地质与地球物理研究所; 中国科学院地质与地球物理研究所兰州油气资源研究中心