An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy

作者：Dester Gary D^*; Rothwell Edward J; Havrilla Michael J

来源：IEEE Microwave and Wireless Components Letters, 2010, 20(5): 298-300.

DOI：10.1109/LMWC.2010.2045600

• Error analysis
• materials testing
• microwave measurements
• mode matching methods
• waveguide junctions

Waveguide probes are useful for extracting the electric and magnetic properties of material layers, but the accuracy of the results is limited by the accuracy of the theoretical model. Using more modes in the expansion of the waveguide fields produces better results, but the computational cost increases with the number of modes squared. This letter analyzes the dependence of solution accuracy on the number of modes used and, based on this, introduces an extrapolation technique that allows the number of modes to be significantly reduced with little loss of accuracy.

• 出版日期2010-5