A Generalized Definition of Unnecessary Test Vectors in Functional Test Sequences

作者：Pomeranz Irith^*

来源：ACM Transactions on Design Automation of Electronic Systems, 2015, 20(2): 29.

DOI：10.1145/2699853

• Reliability
• Functional test sequences
• sequential test generation
• static test compaction
• test vector omission

A class of static test compaction procedures for functional test sequences is based on the omission of unnecessary test vectors. According to the definition used by these procedures, a test vector is unnecessary if all the target faults continue to be detected after it is omitted. This article introduces a more general definition of unnecessary test vectors that allows additional ones to be omitted. According to this definition, a test vector is unnecessary if every target fault can be detected by a sequence that is obtained after omitting the vector, and possibly other vectors. The article develops a procedure for omitting test vectors based on this definition and discusses its effects on the storage requirements and test application time.

• 出版日期2015-2